BENGALURU, India — ARM has set up a VLSI test lab at its design center here to analyze intellectual-property libraries and ARM physical IP, so as to correlate design to silicon behavior. Such activity ...

Power consumption has become a crucial concern in Built-In Self-Test (BIST) due to the switching activity in the Circuit Under-Test (CUT). In this paper, the authors present a novel method which aims ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...