Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use to save tens of ...
This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
Researchers in the PML (Physical Measurement Laboratory) at NIST (National Institute of Standards and Technology) have devised a data-transformation methodology that could ease the reliability ...
The newly developed logic circuits are equipped with diamond-based MOSFETs (metal-oxide-semiconductor field-effect-transistors), and they have two different operation modes. The different modes are a ...
Scientists have succeeded in developing logic circuits equipped with diamond-based MOSFETs (metal-oxide-semiconductor field-effect-transistors) at two different operation modes. This achievement is a ...
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