Modular and open test architectures enable engineers to build the right solution for each challenge, whether integrating ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...

As boring as propeller designs may seem to the average person, occasionally there’s a bit of a dust-up in the media about a ‘new’ design that promises at least a few percent improvement in performance ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...