The market growth is driven by increasing semiconductor testing volumes, advanced node scaling, rising adoption of high-frequency and fine-pitch probes, and expanding OSAT and wafer-level testing ...

Plastronics has developed a stamped alternative for traditional fine-pitch ‘pogo-pins’ – the spring- loaded contacts used for temporary electrical connections in test jigs, for example. “For decades ...

As test targets shrink, the benefits of socketless probing technology grow. As technology advances, more and more electronic components that do bigger and better things are hitting the market. At the ...

Loaded board testing pays for itself by reducing field returns and bone-pile scrap. You seldom read an article about PCBs or semiconductors without encountering test-related phrases and acronyms. Cost ...

Passive microwave PCB probes can equal active probes at far lower cost, is the claim of UK scope maker Pico Technology as it showed its new range of 9GHz probes at European Microwave Week in London.

The limited access afforded to circuit nodes by PCBs densely populated with tiny components seriously challenges traditional PCB test strategies. But while optical and x-ray inspection can help fill ...