Designing for yield is an afterthought in today's design flows, whether it is digital, analog/RF or mixed-signal. The lack of design for yield tools has forced the digital world to accept overly ...
Special cause variation, I love to see it! That’s because I know I’m about to learn something important about my process. A ...
A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...
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