In today’s highly regulated environment for drug development and manufacturing, new challenges have emerged from internal pressures to reduce costs by eliminating waste in the development process, ...
A new algorithm uses a statistical approach to critical process parameter assessment, allowing for faster, more consistent, and less subjective critical process parameter quantification, visualization ...
To ensure success in semiconductor technology development, process engineers must set the allowed ranges for wafer process parameters. Variability must be controlled, so that final fabricated devices ...
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