SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...

Physical defects have always played a role in IC yields, and with today's nanometer technologies design sensitivity to these physical elements has continued to increase. The result has been a ...

High-performance electrodes for lithium-ion batteries can be improved by paying closer attention to their defects -- and capitalizing on them, according to scientists. High-performance electrodes for ...

Fastmicro B.V. is a manufacturer of surface particle defect detection systems and equipment established over 15 years ago. The main product lines include sample surface particle defect scanning, ...

Knots and links of arbitrary complexity are created and reconfigured from topological defect loops in the particle-stabilized chiral nematic liquid crystal using laser tweezers. The laser-induced ...

Extreme ultraviolet (EUV) lithography is finally in production at advanced nodes, but there are still several challenges with the technology, such as EUV mask defects. Defects are unwanted deviations ...

ANNISTON ARMY DEPOT, Ala. -- A new testing procedure, implemented in 2018, has increased the quality of M1 tanks produced at Anniston Army Depot. According to Michael Epps, the depot's Vehicle Quality ...