Decreased system reliability due to overloaded power supplies is a common engineering challenge. In this Q&A-style article submitted by Allied Electronic & Automation, David Norton, technical ...

STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor ...