Each new semiconductor process node represents exciting opportunities for suppliers of design, manufacturing, test, and failure analysis solutions. A new process means new challenges to solve, and ...

Scan diagnosis is an established method for identifying and locating semiconductor defects on devices that fail manufacturing test and on field returns. Effectively selecting the right devices for ...

An atrioventricular septal defect (AVSD) is a condition in which there is a hole between the chambers of the left and right sides of the heart. Additionally, the valves between the chambers may not ...

Congenital heart defects (CHDs) are structural abnormalities of the heart that are present at birth and are the most common type of birth defect. CHDs vary in severity and type, with common examples ...

Siemens Digital Industries Software has brought out a tool to rapidly provide transistor-level isolation for scan chain defects. For 5nm and better nodes where yield ramp heavily relies on chain ...

Teseda, a supplier of silicon validation and failure analysis products, has partnered with Mentor Graphics to link Mentor’s YieldAssist toolset with the Teseda Diagnostic Environment. The goal is to ...

Prenatal diagnosis of congenital heart defects – the most common birth defects in the United States – is associated with improved outcomes. Despite its importance, however, overall prevalence of ...

Fetal echocardiography is increasingly used to detect congenital heart defects before birth, although whether prenatal diagnosis benefits children with heart disease has been questioned. A new study ...