AI-powered test automation is redefining software reliability by reducing flaky tests, expanding coverage, and accelerating ...

IMDEA Software researchers Facundo Molina, Juan Manuel Copia and Alessandra Gorla present FIXCHECK, a novel approach to improve patch fix analysis that combines static analysis, randomized testing and ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.