Morning Overview on MSN

The trucks most likely to reach 300,000 miles share one trait: simple, proven engines

Truck buyers chasing six-figure odometer readings face a straightforward pattern in federal safety records: the pickups that ...

Defect detection automated in diamond, other advanced semiconductors

Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in ...
Compound Semiconductor

An elegant solution for SiC

Today’s commercial SiC substrates are riddled with these atomic-scale imperfections, with thousands threading through each ...
Nature

Probing defect densities at the edges and inside Josephson junctions of superconducting qubits

Tunneling defects in disordered materials form spurious two-level systems which are a major source of decoherence for micro-fabricated quantum devices. For superconducting qubits, defects in tunnel ...
Machine Design

NIST, Collaborators Develop New Way of Detecting the Defect Density in Transistors

Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...
Electronic Design

Researchers Assess Thermal Conductivity, Defect Density of Four GaN Varieties

Semiconductors based on gallium-nitride (GaN) substrates are increasingly important in the power-device landscape. Their thermal conductivity, and thus their ability to conduct and dissipate heat, is ...
Semiconductor Engineering

The Effect Of Pattern Loading On BEOL Yield And Reliability During Chemical Mechanical Planarization

Chemical mechanical planarization (CMP) is required during semiconductor processing of many memory and logic devices. CMP is used to create planar surfaces and achieve uniform layer thickness during ...